Advances in X-Ray Analysis: Volume 33

Advances in X-Ray Analysis: Volume 33

B. K. Tanner (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Paul K. Predecki (eds.)
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Kategori:
Engineering
Tahun:
1990
Penerbit:
Springer US
Bahasa:
english
Halaman:
685
ISBN 10:
146139998X
ISBN 13:
9781461399988
File:
PDF, 21.59 MB
IPFS:
CID , CID Blake2b
english, 1990
Mengunduh (pdf, 21.59 MB)
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    Istilah kunci

     
    ray
    analysis
    diffraction
    stress
    sample
    layer
    peak
    intensity
    surface
    figure
    samples
    method
    films
    measured
    strain
    xrf
    thickness
    angle
    values
    shown
    obtained
    calculated
    crystal
    intensities
    residual
    profile
    standard
    specimen
    shows
    range
    substrate
    radiation
    absorption
    materials
    rays
    measurement
    reflection
    experimental
    background
    characterization
    methods
    layers
    standards
    function
    parameters
    xrd
    lattice
    total
    observed
    fluorescence
    incident
    powder
    depth
    determined
    composition
    temperature
    scattering
    detector
    step
    plane